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The JFET model is derived from the FET model of Shichman and Hodges. The dc characteristics are defined by the parameters VTO and BETA, which determine the variation of drain current with gate voltage, LAMBDA, which determines the output conductance, and IS, the saturation current of the two gate junctions. Two ohmic resistances, RD and RS, are included. Charge storage is modeled by nonlinear depletion layer capacitances for both gate junctions which vary as the -1/2 power of junction voltage and are defined by the parameters CGS, CGD, and PB.
Note that in Spice3f and later, a fitting parameter B has been added.
name |
parameter |
units |
default |
example |
area |
VTO |
threshold voltage (VT0) |
V |
-2.0 |
-2.0 |
|
BETA |
trans-conductance parameter (Beta) |
A/V2 |
1.0e-4 |
1.0e-3 |
* |
LAMBDA |
channel-length modulation parameter ( ) |
1/V |
0 |
1.0e-4 |
|
RD |
drain ohmic resistance |
Ohm |
0 |
100 |
* |
RS |
source ohmic resistance |
Ohm |
0 |
100 |
* |
CGS |
zero-bias G-S junction capacitance (Cgs) |
F |
0 |
5pF |
* |
CGD |
zero-bias G-D junction capacitance (Cgs) |
F |
0 |
1pF |
* |
PB |
gate junction potential |
V |
1 |
0.6 |
|
IS |
gate junction saturation current (IS) |
A |
1.0e-14 |
1.0E-14 |
* |
B |
doping tail parameter |
- |
1 |
|
|
KF |
flicker noise coefficient |
- |
0 |
|
|
AF |
flicker noise exponent |
- |
1 |
|
|
FC |
coefficient for forward-bias |
- |
0.5 |
|
|
TNOM |
parameter measurement temperature |
ºC |
|
50 |
|